Description

A complete Park Systems XE7 atomic force microscope (AFM), the entry research-tier platform in Park's XE family, offered well below replacement cost. This is a full system, not a bare head: it includes the XE7 scanner/head with on-axis optics, the Park AFM Controller, the full acoustic and active-vibration-isolation enclosure on locking casters, and an accessory kit (probe and sample holders, SLD and IR detector cards, spare controller fuse, tweezers, alignment tools). The biggest single discount in the used-AFM market is locked or non-transferable control software; that risk is off the table here. The unit is registered to our Park Systems account, and the complete control and analysis software suite (XEP, XEPBasic, XEI, SmartScan, SmartAnalysis) plus all manuals transfer to the buyer; XE-series software typically licenses against the controller electronics rather than a separate dongle. Cosmetically good with light handling wear; all major components present. Bench-test result (2026-07-15): the system is powered on and the AFM Controller is confirmed alive - it responds on its Ethernet/TCP control interface (pings the controller, with its DSP command/data/status control ports open and accepting connections), the active vibration-isolation table powers up and runs, and the optics and full Park control-PC software stack (XEP/XEPBasic/XEC/Vision) install and stand up. The one remaining step before it can capture a scan is Park software commissioning: XEP needs the instrument-specific calibration database (unique to this scanner's serial), which comes from Park Systems - no original control PC is included. It is a functional research AFM with a software-commissioning gap, not a tested-and-imaging turnkey system. Sold as-is (OEM scheduled maintenance expired 2022); Park Systems support is available to the buyer directly. Heavy, sensitive instrument: local pickup or crated freight from the Philadelphia area, quoted per destination.